Lead sulfide (PbS) is an important IV-VI semiconductor material with narrow bandwidth and wide wave width, which attracts people's attention. Nano-level PbS has many novel optoelectronic properties and has a wide range of applications in the field of optoelectronics, such as infrared optoelectronic devices, photovoltaic devices, light-emitting devices and display devices. In this paper, Pbs is produced by solvent thermal method by using lead acetate as lead source, sulfur power as sulfur source, ethylene glycol as solvent, and acetic acid to provide acidic environment. The reaction acidity, type of lead source, amount of sulfur source and other aspects will be explored. The products obtained under different conditions were characterized by X-ray diffraction (XRD), optical microscopy and scanning electron microscopy (SEM). The results showed that PbS produced at 140°C for 24 hours, using 14mL ethylene glycol and 1.2mL acetic acid has the best morphology. It has a non-planar six-arm symmetrical structure. Finally, we prepare the lead sulfide composite Ni/PbS, and characterized it.

To address the problem that the imaging inversion method based on a single model in integrated aperture imaging is difficult to effectively correct model errors and perform accurate image reconstruction, a dual-model (DM)-based integrated aperture imaging inversion method is proposed for correcting the parametric errors of the inversion model and performing highly accurate millimeter-wave image reconstruction of the target scene. In view of the different parameter sensitivities of the Fourier transform (MFFT) model and the G-matrix (GM) model, the proposed DM method first corrects the imaging parameters with errors accurately by comparing the reconstruction errors of the two models; then recon-structs a high-precision target image based on the accurate GM model with the help of an improved regularization method. It is proved by simulation experiments that the proposed DM method can effectively correct the parameter errors of the imaging model and reconstruct the target scene with high accuracy in millimeter wave images compared with the traditional single-model imaging method.